Title :
THE ARCHlTECTURAL ELEMENTS OF A SYMMETRIC FAULT-TOLERANT MULTIPROCESSOR
Author :
Hopkins, Albert L., Jr. ; Smith, T. Basil, III
Keywords :
Circuit testing; Clocks; Distributed computing; Fault tolerance; Fault tolerant systems; Integrated circuit interconnections; Laboratories; Redundancy; Space vehicles; Vehicle dynamics;
Conference_Titel :
Fault-Tolerant Computing, 1995, Highlights from Twenty-Five Years., Twenty-Fifth International Symposium on
Print_ISBN :
0-8186-7150-5
DOI :
10.1109/FTCSH.1995.532605
