Title :
Engineering change using spare cells with constant insertion
Author :
Yu-Min Kuo ; Ya-Ting Chang ; Shih-Chieh Chang ; Marek-Sadovvska, M.
Author_Institution :
Nat. Tsing Hua Univ., Hsinchu
Abstract :
In the VLSI design process, a design implementation often needs to be corrected because of new specifications or design constraint violations. This correction process is referred to as engineering change (EC). Usually, an EC problem is resolved by using spare cells, which have been inserted into the unused spaces of a chip. In this paper, we propose an iterative method to generate feasible mapping solutions for an EC problem considering spare cells whose inputs may be tied to Vdd or Gnd, called constant insertion. Applying constant insertion can increase a cell´s flexibility in aspect of functionalities, so far-away spare cells need not be used just for some specific functionality. Our experimental results show that the area in which there are enough spare cells for a mapping solution with constant insertion is only 82% of the area without constant insertion.
Keywords :
VLSI; integrated circuit design; iterative methods; VLSI design process; constant insertion; correction process; design constraint violations; engineering change; feasible mapping solutions; iterative method; spare cells; specification violations; Circuits; Design engineering; Dynamic programming; Equations; Heuristic algorithms; Iterative methods; Process design; Routing; Timing; Very large scale integration;
Conference_Titel :
Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-1381-2
DOI :
10.1109/ICCAD.2007.4397321