Title :
Formal verification at higher levels of abstraction
Author :
Kroening, Daniel ; Seshia, Sanjit A.
Author_Institution :
Oxford Univ., Oxford
Abstract :
Most formal verification tools on the market convert a high-level register transfer level (RTL) design into a bit-level model. Algorithms that operate at the bit-level are unable to exploit the structure provided by the higher abstraction levels, and thus, are less scalable. This tutorial surveys recent advances in formal verification using high-level models. We present word-level verification with predicate abstraction and satisfiability modulo theories (SMT) solvers. We then describe techniques for term-level modeling and ways to combine word-level and term-level approaches for scalable verification.
Keywords :
formal verification; abstraction; bit-level model; formal verification; high-level register transfer level; satisfiability modulo theories; term-level approaches; word-level approaches; Arithmetic; Circuit synthesis; Formal verification; Hardware design languages; Laboratories; Logic; Protocols; Registers; Simultaneous localization and mapping; Surface-mount technology;
Conference_Titel :
Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-1381-2
Electronic_ISBN :
1092-3152
DOI :
10.1109/ICCAD.2007.4397326