Title :
Reliability in Layered Networks with Random Link Failures
Author :
Lee, Kayi ; Lee, Hyang-Won ; Modiano, Eytan
Author_Institution :
Massachusetts Inst. of Technol., Cambridge, MA, USA
Abstract :
We consider network reliability in layered networks where the lower layer experiences random link failures. In layered networks, each failure at the lower layer may lead to multiple failures at the upper layer. We generalize the classical polynomial expression for network reliability to the multi-layer setting. Using random sampling techniques, we develop polynomial time approximation algorithms for the failure polynomial. Our approach gives an approximate expression for reliability as a function of the link failure probability, eliminating the need to resample for different values of the failure probability. Furthermore, it gives insight on how the routings of the logical topology on the physical topology impact network reliability. We show that maximizing the min cut of the (layered) network maximizes reliability in the low failure probability regime. Based on this observation, we develop algorithms for routing the logical topology to maximize reliability.
Keywords :
polynomials; telecommunication links; telecommunication network reliability; telecommunication network routing; telecommunication network topology; failure polynomial; layered networks reliability; multi-layer setting; polynomial expression; polynomial time approximation algorithms; random link failures; random sampling techniques; Algorithm design and analysis; Approximation algorithms; Circuit topology; Communications Society; Network topology; Optical fiber communication; Polynomials; Routing; Sampling methods; Telecommunication network reliability;
Conference_Titel :
INFOCOM, 2010 Proceedings IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-5836-3
DOI :
10.1109/INFCOM.2010.5461985