Title :
Development of speckle interferometry algorithm and system
Author :
Shamsir, Atika Atira Mohamad ; Jafri, Mohd Zubir Mat ; San, Lim Hwee
Author_Institution :
Sch. Of Phys., Univ. Sains Malaysia, Minden, Malaysia
Abstract :
This paper discusses about Electronic speckle pattern interferometry. It is a wholefield, non destructive measurement method widely used in the industries such as detection of defects on metal bodies.
Keywords :
electronic speckle pattern interferometry; ESPI method; defect detection; electronic speckle pattern interferometry method; nondestructive measurement method; speckle interferometry algorithm;
Conference_Titel :
Enabling Science and Nanotechnology (ESciNano), 2010 International Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4244-8853-7
DOI :
10.1109/ESCINANO.2010.5700951
