DocumentCode :
2331758
Title :
Soft-edge flip-flops for improved timing yield: design and optimization
Author :
Joshi, Vivek ; Blaauw, David ; Sylvester, Dennis
Author_Institution :
Michigan Univ., Ann Arbor
fYear :
2007
fDate :
4-8 Nov. 2007
Firstpage :
667
Lastpage :
673
Abstract :
Parameter variations cause high yield losses due to their large impact on circuit delay. In this paper, we propose the use of so-called soft-edge flip-flops as an effective way to mitigate these yield losses. Soft-edge flip-flops have a small window of transparency (ranging from 0.25-3 FO4) instead of a hard edge, allowing limited cycle stealing on critical paths, and thus compensating for delay variations. By enabling time borrowing, soft-edge flip-flops allow random delay variations to average out across multiple logic stages. In addition, they address small amounts of delay unbalance between logic stages, further maximizing the frequency of operation. We develop a library of soft-edge flip-flops with varying amounts of softness. We show that the power and area overhead of soft-edge flip-flops grows directly with the amount of softness. We then propose a statistically aware flip-flop assignment algorithm that maximizes the gain in timing yield while minimizing the incurred power overhead. Experimental results on a wide range of benchmark circuits show that the proposed approach improves the mean delay by 1.9-22.3% while simultaneously reducing the standard deviation of delay by 1.9-24.1% while increasing power by a small amount (0.3-2.8%).
Keywords :
delays; flip-flops; logic design; timing; benchmark circuits; circuit delay; high yield losses; incurred power overhead minimization; mean delay; random delay variations; soft-edge flip-flops; Circuits; Clocks; Delay effects; Design optimization; Flip-flops; Frequency; Latches; Libraries; Logic; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
ISSN :
1092-3152
Print_ISBN :
978-1-4244-1381-2
Electronic_ISBN :
1092-3152
Type :
conf
DOI :
10.1109/ICCAD.2007.4397342
Filename :
4397342
Link To Document :
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