DocumentCode
2331811
Title
Including inductance in static timing analysis
Author
Shebaita, Ahmed ; Petranovic, Dusan ; Ismail, Yehea
Author_Institution
Northwestern Univ., Evanston
fYear
2007
fDate
4-8 Nov. 2007
Firstpage
686
Lastpage
691
Abstract
In this paper analytical expressions are derived for effective load capacitances of RLC interconnects to accurately estimate both the propagation delay and transition time at the output of a CMOS gate. The new effective capacitance calculation technique poses no extra complexity as compared to the RC based approaches but can accommodate inductance. These new expressions are derived based on a generalized driving point admittance. The generalized driving point admittance takes inductance into consideration and hence accounts for the inductive shielding that in some cases can even exceed the resistive shielding in current technologies. Another improvement in the new effective capacitance calculation method is the utilization of a more general waveform shape that accounts for the non-monotonic behavior due to inductance effects. It is shown throughout the paper that two effective capacitances are required for accurate estimation of the propagation delay and rise time with an RLC interconnect load. Simulation results show that the error in propagation delays and rise times when neglecting inductance can be over 60% as compared to an RLC model in realistic interconnects. On the other hand, simulations show that the propagation delay and rise time maximum errors associated with the proposed approach are less than 10% as compared to SPICE.
Keywords
CMOS logic circuits; RLC circuits; capacitance; inductance; logic gates; timing circuits; CMOS gate; RLC interconnects; generalized driving point admittance; inductance; load capacitance; propagation delay; static timing analysis; transition time; Admittance; Capacitance; Delay effects; Delay estimation; Inductance; Packaging; Propagation delay; Timing; Voltage; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on
Conference_Location
San Jose, CA
ISSN
1092-3152
Print_ISBN
978-1-4244-1381-2
Electronic_ISBN
1092-3152
Type
conf
DOI
10.1109/ICCAD.2007.4397345
Filename
4397345
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