DocumentCode :
2332357
Title :
A novel intensity based optical proximity correction algorithm with speedup in lithography simulation
Author :
Yu, Peng ; Pan, David Z.
Author_Institution :
Univ. of Texas, Austin
fYear :
2007
fDate :
4-8 Nov. 2007
Firstpage :
854
Lastpage :
859
Abstract :
It is important to reduce the optical proximity correction (OPC) runtime while maintaining a good result quality. In this paper, we obtain a better formula, which theoretically speeds up the widely used method, optimal coherent approximations (OCA´s), by a factor of 2times. We speed up the OPC algorithm further by making it intensity based (IB-OPC), because it requires much less intensity simulations than the conventional edge placement error (EPE) based OPC algorithms. In addition, the IB-OPC algorithm, which uses the efficiently computed sensitivity information, converges faster than the EPE based OPC. Our IB-OPC experimental results show a runtime speedup of up to 15times with a comparable result quality as of the EPE based OPC.
Keywords :
approximation theory; error analysis; photolithography; proximity effect (lithography); quality management; sensitivity analysis; conventional edge placement error; intensity based optical proximity correction algorithm; lithography simulation; optimal coherent approximations; Computational modeling; Computer simulation; Concurrent computing; Convergence; Hardware; Lithography; Multithreading; Optical sensors; Runtime; Shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 2007. ICCAD 2007. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
ISSN :
1092-3152
Print_ISBN :
978-1-4244-1381-2
Electronic_ISBN :
1092-3152
Type :
conf
DOI :
10.1109/ICCAD.2007.4397371
Filename :
4397371
Link To Document :
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