Abstract :
It is important to reduce the optical proximity correction (OPC) runtime while maintaining a good result quality. In this paper, we obtain a better formula, which theoretically speeds up the widely used method, optimal coherent approximations (OCA´s), by a factor of 2times. We speed up the OPC algorithm further by making it intensity based (IB-OPC), because it requires much less intensity simulations than the conventional edge placement error (EPE) based OPC algorithms. In addition, the IB-OPC algorithm, which uses the efficiently computed sensitivity information, converges faster than the EPE based OPC. Our IB-OPC experimental results show a runtime speedup of up to 15times with a comparable result quality as of the EPE based OPC.
Keywords :
approximation theory; error analysis; photolithography; proximity effect (lithography); quality management; sensitivity analysis; conventional edge placement error; intensity based optical proximity correction algorithm; lithography simulation; optimal coherent approximations; Computational modeling; Computer simulation; Concurrent computing; Convergence; Hardware; Lithography; Multithreading; Optical sensors; Runtime; Shape;