DocumentCode
2332433
Title
Functional testing and reconfiguration of MIMD machines
Author
Aktouf, Ch ; Robach, Ch ; Mazaré, G. ; Johansson, J.
Author_Institution
LGI/IMAG, Grenoble, France
fYear
1993
fDate
27-29 Oct 1993
Firstpage
72
Lastpage
79
Abstract
The authors present a strategy for testing MIMD parallel machines. First they detail a functional testing methodology. Based on a functional fault model for the communications between processors, the authors propose a distributed diagnosis strategy and the test program generation process. Next, a fault-tolerant routing algorithm is proposed. Taking into account the results obtained from the testing phase, this algorithm allows successful routing of messages between fault-free cells
Keywords
parallel architectures; MIMD machines; distributed diagnosis strategy; fault-free cells; fault-tolerant routing algorithm; functional fault model; parallel machines; reconfiguration; test program generation; Circuit faults; Circuit testing; Fault diagnosis; Fault tolerance; Microelectronics; Multiprocessing systems; Parallel architectures; Parallel machines; Routing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 1993., The IEEE International Workshop on
Conference_Location
Venice
ISSN
1550-5774
Print_ISBN
0-8186-3502-9
Type
conf
DOI
10.1109/DFTVS.1993.595645
Filename
595645
Link To Document