Title :
A time-dependent SPICE model for single electron box and its application to logic gates at low and high temperatures
Author :
Gooraji, Farzad Ahmadi ; Sharifi, Mohammad Javad ; Bahrepour, Davoud
Author_Institution :
Dept. of Electr. & Comput. Eng., Shahid Beheshti Univ., Tehran, Iran
Abstract :
In this paper, we propose a circuit model for SEB that can operate in high temperature and also in the intrinsic frequency range of these devices. This model can be used for an estimation of the bit error rate in logic applications of these devices as well.
Keywords :
SPICE; circuit simulation; high-temperature electronics; integrated circuit design; logic gates; single electron devices; SEB; bit error rate; circuit model; logic gate; single electron box; time-dependent SPICE model;
Conference_Titel :
Enabling Science and Nanotechnology (ESciNano), 2010 International Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4244-8853-7
DOI :
10.1109/ESCINANO.2010.5701021
