DocumentCode :
2333258
Title :
An investigation on sampling technique for multi-objective restricted Boltzmann machine
Author :
Shim, Vui Ann ; Tan, Kay Chen ; Chia, Jun Yong
Author_Institution :
Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
fYear :
2010
fDate :
18-23 July 2010
Firstpage :
1
Lastpage :
8
Abstract :
Estimation of distribution algorithms are increasingly gaining research interest due to their linkage information exploration feature. Two main mechanisms which contribute towards the success of the algorithms are probabilistic modeling and sampling method. Recent attention has been directed towards the development of probabilistic building technique. However, research on the sampling approach is less developed. Thus, this paper carries out an investigation on sampling technique for a novel multi-objective estimation of distribution algorithm - multi-objective restricted Boltzmann machine. Two variants of a new sampling technique based on energy value of the solutions in the trained network are proposed to improve the efficiency of the algorithm. Probabilistic information which is usually clamped into marginal probability distribution may hinder the algorithm in producing solutions that have high linkage dependency between variables. The proposed approach will overcome this limitation of probabilistic modeling in restricted Boltzmann machine. The empirical investigation shows that the proposed algorithm gives promising result in term of convergence and convergence rate.
Keywords :
Boltzmann machines; convergence; probability; sampling methods; convergence; distribution algorithms estimation; linkage information exploration; multiobjective restricted Boltzmann machine; probabilistic building technique; probabilistic modeling; sampling technique; trained network; Algorithm design and analysis; Computational modeling; Convergence; Couplings; Probabilistic logic; Probability distribution; Training;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Evolutionary Computation (CEC), 2010 IEEE Congress on
Conference_Location :
Barcelona
Print_ISBN :
978-1-4244-6909-3
Type :
conf
DOI :
10.1109/CEC.2010.5586469
Filename :
5586469
Link To Document :
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