Title :
Morphology and dielectric properties of uniaxially and biaxially-oriented polycarbonate capacitor films
Author :
Yen, S.-P.S. ; Lowry, L. ; Bankston, C.P. ; Capozzi, V.F.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fDate :
29 Oct-2 Nov 1989
Abstract :
A reflective X-ray diffraction method developed to determine the absolute Xc (crystallinity) of UX and BX (uniaxially and biaxially oriented) PC (polycarbonate) film is described. Conditions for achieving optimum properties for producing BX high-Xc and isotropic PC film were found. For BX PC film of identical thickness to UX PC film the electric breakdown strength was found to be proportional to Xc. The thermal and mechanical properties as well as the direct-current electric breakdown strengths of the newly developed isotropic high-Xc BX PC film are compared with those of the anisotropic commercial PC capacitor film. Capacitors made from the high-Xc isotropic BX PC film when subjected to a 1000-hour 100°C, 42-V DC life test showed no change in dissipation factor and no change in capacitance, and they met 100°C insulation resistance test requirements. In general, it is concluded that this novel BX PC film is much superior to the traditional UX commercial capacitor PC film
Keywords :
X-ray diffraction examination of materials; capacitance; capacitors; dielectric thin films; electric breakdown of solids; electric strength; life testing; organic insulating materials; polymer films; polymer structure; 100 C; 42 V; DC life test; biaxially oriented film; capacitance; crystallinity; dielectric properties; dissipation factor; electric breakdown strength; insulation resistance test; isotropic film; mechanical properties; morphology; optimum properties; polycarbonate capacitor films; polymer film; reflective X-ray diffraction; thermal properties; uniaxially oriented film; Capacitors; Crystallization; Dielectrics; Electric breakdown; Insulation testing; Life testing; Mechanical factors; Morphology; Optical films; X-ray diffraction;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1989. Annual Report., Conference on
Conference_Location :
Leesburg, VA
DOI :
10.1109/CEIDP.1989.69575
