DocumentCode :
2333591
Title :
A novel general event-condition-state pattern framework
Author :
Diao, Hongjun ; Zhu, Fei
Author_Institution :
Sch. of Comput. Sci. & Technol., Soochow Univ., Suzhou, China
fYear :
2009
fDate :
25-27 May 2009
Firstpage :
1024
Lastpage :
1027
Abstract :
A novel event-condition-state pattern framework which is an event-based finite state machine is proposed. The framework improves GoF state pattern by re-segments GoF Context into a class which is responsible for management and a class which is responsible for operation interface. Complicated relations among event, condition and state are analyzed. Essential components for implementation, such as management, state transferring, and event triggering mechanism, are also designed in the framework. With the pattern framework, much effort in software development will be relieved, thus simplifying the whole development work. Taking advantage of it, different versions of a same input method system which are respectively for Windows Mobile system and Symbian are the developed in intelligent mobile phone. The pattern framework simplifies developing effort, and provides much convenience in later maintenance and update as well.
Keywords :
application program interfaces; finite state machines; mobile computing; object-oriented programming; operating systems (computers); software development management; software maintenance; GoF state pattern; Symbian system; Windows mobile system; event-based finite state machine; general event-condition-state pattern framework; input method system; intelligent mobile phone; operation interface; software development; software maintenance; state management class; Automata; Computer science; Concrete; Internet; Logic; Mobile handsets; Office automation; Programming; System software; Utility programs; event condition state; event mapping; input method; mobile developing; patten design;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics and Applications, 2009. ICIEA 2009. 4th IEEE Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-2799-4
Electronic_ISBN :
978-1-4244-2800-7
Type :
conf
DOI :
10.1109/ICIEA.2009.5138356
Filename :
5138356
Link To Document :
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