DocumentCode
2333756
Title
Strategies for functional testing of microprocessors
Author
Noore, A. ; Weinrich, B.E.
Author_Institution
West Virginia Univ., Morgantown, WV, USA
fYear
1990
fDate
11-13 Mar 1990
Firstpage
431
Lastpage
435
Abstract
Effective strategies for generating tests for microprocessors are presented. Modular block, comprehensive instruction set, and microinstruction set approaches are proposed. These practical approaches are viable alternatives to the exhaustive testing which aims at considering all possible instructions, addressing modes and data patterns. The proposed approaches are versatile and effective, especially in the user environment
Keywords
computer testing; logic testing; microcomputers; addressing modes; computer testing; data patterns; functional testing; logic testing; microcomputers; microinstruction set; microprocessors; modular block instruction set; Arithmetic; Logic testing; Memory management; Microprocessors; Multiplexing; Performance evaluation; Read-write memory; Registers; System testing; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
System Theory, 1990., Twenty-Second Southeastern Symposium on
Conference_Location
Cookeville, TN
ISSN
0094-2898
Print_ISBN
0-8186-2038-2
Type
conf
DOI
10.1109/SSST.1990.138184
Filename
138184
Link To Document