Title :
An automated infrastructure for real-time monitoring of multi-core Systems-on-Chip
Author :
Kornaros, George ; Christoforakis, Ioannis ; Astrinaki, Maria
Author_Institution :
Electron. & Comput. Eng. Dept., Tech. Univ. of Crete, Kounoupidiana, Greece
Abstract :
Requirements for rapid turnaround development of complex multi-core Systems-on-Chip nowadays have advanced to the level at which a number of different in principle validation techniques have to be performed in short time. Quite common are hybrids of passive debugging of Systems-on-Chip and event-driven active verification. On top of these, we present a novel highly flexible verification infrastructure, in which parameters of monitoring can be accessible in real-time while the measurement itself is being performed. Instead of simply observing components under development, the proposed infrastructure enables the designer to interact, monitor and adjust in real-time system parameters or application software. This paper explores different microarchitecture alternatives to efficiently support flexible real-time monitoring via hardware configurable monitors which can provide abstractions of the information. A quantitative evaluation of the proposed methodology on a system-on-FPGA provides results that can serve as guidelines for system-level designers, proving the need for flexible and at the same time efficient filters for real-time monitors inside complex multi-core SoCs.
Keywords :
field programmable gate arrays; multiprocessing systems; system-on-chip; application software; automated infrastructure; complex multicore systems-on-chip; event-driven active verification; flexible verification infrastructure; hardware configurable monitors; microarchitecture alternatives; principle validation techniques; rapid turnaround development; real-time monitoring; system-on-FPGA; Computer aided manufacturing; Debugging; Hardware; Monitoring; Real time systems; Software; System-on-a-chip;
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2012 IEEE 15th International Symposium on
Conference_Location :
Tallinn
Print_ISBN :
978-1-4673-1187-8
Electronic_ISBN :
978-1-4673-1186-1
DOI :
10.1109/DDECS.2012.6219025