DocumentCode :
2334145
Title :
Efficient link-level error resilience in 3D NoCs
Author :
Pasca, Vladimir ; Rehman, Saif-Ur ; Anghel, Lorena ; Benabdenbi, Mounir
Author_Institution :
TIMA Lab., INP-Grenoble, Grenoble, France
fYear :
2012
fDate :
18-20 April 2012
Firstpage :
127
Lastpage :
132
Abstract :
Due to their scalability and flexibility, Networks-on-Chip are among the most popular communication fabrics for 3D integrated systems. 3D NoCs consist of a mix of inter-die and intra-die links implemented in different technologies. Thus, in order to guarantee correct data transmission through the 3D NoC, link reliability must be ensured. Error resilience techniques have been developed to protect links at the expense of increased area and power consumption, and reduced performance. In this paper, error resilience schemes are implemented for NoC links in stacked 3D integrated systems. We analyze, with respect to area / power overheads and reliability, the impact of inter-die and intra-die link-level error resilience techniques on a 3D NoC router architecture. Our results show that inter-die link protection with correction-based schemes and interleaved single error correction (SEC) codes are more efficient than traditional protection on all links.
Keywords :
error correction codes; integrated circuit reliability; interleaved codes; network routing; network-on-chip; 3D NoC router architecture; SEC; area consumption; area overheads; communication fabrics; correction-based schemes; data transmission; efficient link-level error resilience; inter-die links; interleaved single error correction codes; intra-die links; link protection; link reliability; networks-on-chip; power consumption; power overheads; stacked 3D integrated systems; Automatic repeat request; Equations; Forward error correction; Reliability; Resilience; Three dimensional displays; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2012 IEEE 15th International Symposium on
Conference_Location :
Tallinn
Print_ISBN :
978-1-4673-1187-8
Electronic_ISBN :
978-1-4673-1186-1
Type :
conf
DOI :
10.1109/DDECS.2012.6219038
Filename :
6219038
Link To Document :
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