Title :
Repetitive learning control for the correction of linear and nonlinear transducer measurement errors: sensitivity analysis of the method
Author_Institution :
Dept. Biol. & Agric. Eng., Georgia Univ., Athens, GA, USA
Abstract :
Successful implementation of a transmission level harmonic measurement system requires accurate and reliable measurement of harmonic voltages and currents. Existing substation instrument transformers are designed for harmonic-free 60 Hz measurements. Hence, their use to measure harmonics leads to the introduction of resonance as well as saturation errors in the measurements. An on-line error correction method to correct for these measurement errors has been proposed in previous publications. The error correction was formulated as an output tracking problem where the distorted measurements were used along with the experimentally developed transformer model to reconstruct the transformer input. The scope of this paper is to develop a sensitivity analysis of the error correction method with respect to the transformer parameters. Results of this analysis indicate that the sensitivity of the method with respect to the transformer parameters is quite low.
Keywords :
electric current measurement; error correction; measurement errors; power system harmonics; power system measurement; resonance; sensitivity analysis; transducers; voltage measurement; 60 Hz; distorted measurements; harmonic currents measurement; harmonic voltages measurement; linear transducer measurement errors; nonlinear transducer measurement errors; output tracking problem; power system harmonics; repetitive learning control; resonance; saturation errors; sensitivity analysis; substation; transformer input reconstruction; transformer model; transmission level harmonic measurement system; Circuit faults; Distortion measurement; Error correction; Instrument transformers; Power harmonic filters; Power system harmonics; Predistortion; Sensitivity analysis; Transducers; Transfer functions;
Conference_Titel :
Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-4943-1
DOI :
10.1109/IAS.1998.729747