Title :
Sensitivity study of interconnect variation using statistical experimental design
Author :
Lin, Zhihao Jeff ; Spanos, Costas J.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Abstract :
We present a sensitivity study approach to evaluate the effects of interconnect variations on the performance of large, complex circuits. The approach uses highly efficient designed experiments. The results from the study of a multiplier circuit are presented as an example
Keywords :
circuit complexity; design of experiments; integrated circuit design; integrated circuit interconnections; integrated circuit metallisation; integrated circuit testing; multiplying circuits; sensitivity; circuit performance; complex circuits; designed experiments; interconnect variation effects; interconnect variation sensitivity; multiplier circuit; statistical experimental design; Analytical models; Circuit optimization; Circuit simulation; Delay; Design for experiments; Integrated circuit interconnections; Matrix converters; Microprocessors; Process design; Wires;
Conference_Titel :
Statistical Metrology, 1998. 3rd International Workshop on
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-4338-7
DOI :
10.1109/IWSTM.1998.729773
