• DocumentCode
    2334660
  • Title

    Auto-calibration techniques in built-in jitter measurement circuit

  • Author

    Cheng, Chih-Ping ; Liu, Jen-Chieh ; Cheng, Kuo-Hsing

  • Author_Institution
    Dept. of Electr. Eng., Nat. Central Univ., Jungli, Taiwan
  • fYear
    2012
  • fDate
    18-20 April 2012
  • Firstpage
    248
  • Lastpage
    249
  • Abstract
    This paper presents a built-in jitter measurement (BIJM) circuit with auto-calibration techniques for 1 GHz clock signal measurement. To measure the cycle-to-cycle jitter, a self-referenced circuit, without an external reference clock, is applied. A multi-phase oscillator (MPO) and a timing amplifier (TA) are used to enhance the timing resolution and to generate the high-speed multi-phase outputs for a multi-phase sampler (MPS). In order to against the process variation, the calibration circuits are applied to calibrate the MPO timing resolution and the TA gain. They are rewarded with a reduction of the variation of the MPO timing resolution by 65% and a reduction of the variation of the TA gain by 61.2% under the process variation, respectively.
  • Keywords
    amplifiers; calibration; measurement systems; oscillators; signal processing equipment; timing jitter; BIJM circuit; MPO timing resolution; MPS; TA gain; autocalibration techniques; built-in jitter measurement circuit; calibration circuits; clock signal measurement; cycle-to-cycle jitter; external reference clock; frequency 1 GHz; multiphase oscillator; multiphase outputs; multiphase sampler; process variation; self-referenced circuit; timing amplifier; timing resolution; CMOS integrated circuits; Calibration; Clocks; Jitter; Oscillators; Radiation detectors; Timing; built-in jitter measurement (BIJM); calibration; mulit-phase; time-to-digital converter (TDC); timing amplifier (TA);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2012 IEEE 15th International Symposium on
  • Conference_Location
    Tallinn
  • Print_ISBN
    978-1-4673-1187-8
  • Electronic_ISBN
    978-1-4673-1186-1
  • Type

    conf

  • DOI
    10.1109/DDECS.2012.6219066
  • Filename
    6219066