Title : 
A new instrument for measuring visual strain caused by video data terminal operations
         
        
            Author : 
Muraoka, Tetsuya ; Nakashima, Noboru ; Mizushina, Shizuo ; Shimodaira, Yoshifumi ; Ikeda, Hiroaki
         
        
            Author_Institution : 
Dept. of Welfare Eng., Polytech.. Univ., Kanagawa, Japan
         
        
        
        
        
        
            Abstract : 
In order to measure the visual strain caused by continuous video data terminal (VDT) operations, a new instrument is constructed utilizing both the personal computer and the software, in which a series of Landolt´s rings used to test the visual sensation are demonstrated on the computer display, since the visual strain is accumulated during the VDT operations. For the VDT operations, the Landolt´s rings demonstrated on the computer display check if the results of the visual strain tests indicate the state that the accumulated visual strain has exceeded the maximum acceptable limit. Using this new instrument, continuous VDT operations for 90 minutes were found to cause remarkable visual strain which is unacceptable for each VDT operator. The results of the tests utilizing this new instrument have confirmed that a coffee break is needed after a continuous VDT operation for 90 minutes.
         
        
            Keywords : 
biomedical measurement; computer displays; health hazards; human factors; medical diagnostic computing; vision defects; Landolt´s rings; accumulated visual strain; computer display; personal computer; software; video data terminal operations; visual sensation testing; visual strain measurement; Capacitive sensors; Computer displays; Data engineering; Electric variables measurement; Eyes; Instruments; Mechanical variables measurement; Software measurement; Strain measurement; Testing;
         
        
        
        
            Conference_Titel : 
Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE
         
        
            Conference_Location : 
St. Louis, MO, USA
         
        
        
            Print_ISBN : 
0-7803-4943-1
         
        
        
            DOI : 
10.1109/IAS.1998.729779