Title :
Efficient yield estimation within automated analog IC design
Author :
Gielen, G. ; Debyser, G. ; Leyn, F. ; Sansen, W.
Author_Institution :
Dept. of Electr. Eng., Katholieke Univ., Leuven, Belgium
Abstract :
A new statistical design methodology is presented that uses symbolic methods to increase the efficiency of statistical IC design. The methodology is implemented in an environment that combines the symbolic design equation manipulation engine DONALD with the generic statistical design system GOSSIP. DONALD is used to generate the initial design and to create the symbolic computational plan that is used by GOSSIP for the actual statistical yield, Cp and Cpk optimization, where Cp, Cpk are process capability indices. The strengths and weaknesses of the proposed approach are discussed, and its accuracy and speed are compared with the traditional method of using a SPICE-type circuit simulator in the inner loop of the statistical optimization. Overall, a significant speed-up of the statistical IC design efficiency is observed
Keywords :
Monte Carlo methods; SPICE; analogue integrated circuits; circuit CAD; circuit optimisation; circuit simulation; integrated circuit design; integrated circuit yield; parameter estimation; software tools; statistical analysis; symbol manipulation; Cp optimization; Cpk optimization; DONALD symbolic design equation manipulation engine; GOSSIP generic statistical design system; Monte Carlo simulation; SPICE-type circuit simulator; automated analog IC design; initial design generation; process capability indices; statistical IC design; statistical IC design efficiency; statistical design methodology; statistical optimization inner loop; statistical yield; symbolic computational plan; symbolic methods; yield estimation; Analog integrated circuits; Circuit faults; Computational modeling; Design methodology; Engines; Equations; Job design; Monte Carlo methods; SPICE; Yield estimation;
Conference_Titel :
Statistical Metrology, 1998. 3rd International Workshop on
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-4338-7
DOI :
10.1109/IWSTM.1998.729788