Title :
Study on fast fault diagnosis of capacitor with tolerance based on BIST
Author :
Min, Zhu ; Chao, Sun ; Chunling, Yang
Author_Institution :
Sch. of Electr. Eng. & Autom., Harbin Inst. of Technol., Harbin, China
Abstract :
This paper presents a novel and practical method for the fault diagnosis of capacitor with tolerance based on the technique of (Built-In Self-Test). An easily achievable square-wave is used as the test pattern. The method adopts the detecting circuit for the interpretation of test response and after filtering, uses the direct current signal as the output of test response. We obtain the results of the test from the output of a comparator, which is a part of the analog circuits. The proposed method has the advantages of simple test vector, rapid diagnosis and high diagnosis accuracy.
Keywords :
built-in self test; capacitors; comparators (circuits); fault diagnosis; square-wave generators; analog circuits; built-in self-test; capacitor; comparator output; detecting circuit; direct current signal; fast fault diagnosis; rapid diagnosis accuracy; square-wave generator; test response; tolerance based BIST technique; Analog circuits; Automatic testing; Automation; Built-in self-test; Capacitors; Circuit faults; Circuit testing; Fault diagnosis; Filters; Test pattern generators; BIST; DFT; ORA; fault diagnosis;
Conference_Titel :
Industrial Electronics and Applications, 2009. ICIEA 2009. 4th IEEE Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-2799-4
Electronic_ISBN :
978-1-4244-2800-7
DOI :
10.1109/ICIEA.2009.5138437
