DocumentCode
2335810
Title
Effects of the velocity-space particle loss on the behavior of field-reversed configurations
Author
Hsiao ; Chiang
Author_Institution
Dept. of Nucl. Eng., Pennsylvania State Univ., University Park, PA, USA
fYear
1989
fDate
0-0 1989
Firstpage
119
Lastpage
120
Abstract
Summary Form only given, as follows. The electric current profiles in the presence of the velocity-space particle loss (VSPL) have been calculated. A self-consistent, one-dimensional magnetic field has been obtained by solving Ampere´s law. Since more ions are lost in the separatix and the small-r regions, causing charge separation in these two regions, the electric field can be developed in the direction pointing away from the field null. The electric field structure developed from the VSPL mechanism can be used to explain the origin of the rotation and the unusually broad edge layer. For the origin of the rotation, quantitative calculations of the stable period have been carried out. Qualitatively, the dependence of the stable period on the experimental parameters such as temperature, magnetic field density, and plasma length is totally consistent with the VSPL predictions. Quantitative results have also shown certain consistencies. The VSPL mechanism can explain inconsistencies observed between the inferred end-loss time and the MHD (magnetohydrodynamic) end-loss time to some extent.<>
Keywords
pinch effect; plasma instability; plasma magnetohydrodynamics; plasma temperature; plasma turbulence; Ampere´s law; MHD; charge separation; edge layer; electric current profiles; electric field; end-loss time; field-reversed configurations; one-dimensional magnetic field; plasma length; rotation; separatix; small-r regions; stable period; temperature; velocity-space particle loss; Magnetohydrodynamics; Plasma pinch; Plasma properties; Plasma stability; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1989. IEEE Conference Record - Abstracts., 1989 IEEE International Conference on
Conference_Location
Buffalo, NY, USA
Type
conf
DOI
10.1109/PLASMA.1989.166177
Filename
166177
Link To Document