Title :
Dynamics of sheaths in low pressure RF discharges
Author_Institution :
California Univ., Berkeley, CA, USA
Abstract :
Summary Form only given, as follows. Low-pressure RF discharges are widely used for materials processing. Typical parameters are pressure of 1-100 mtorr, frequency of 13.56 MHz, and RF voltage of 50-1000 V. A reasonably complete picture of the dynamics of these sheaths has been developed. Some typical results for a high-voltage sheath driven by a sinusoidal current source, under the assumptions of time-independent, collisionless ion motion and inertialess electrons, are: (1) the ion sheath thickness s/sub m/ is square root 50/27 larger than a Child´s law sheath for the same DC voltage and ion current density; (2) the sheath capacitance per unit area for the fundamental voltage harmonic is 1.226 epsilon /sub 0//s/sub m/, where epsilon /sub 0/ is the free space permittivity; (3) the ratio of the DC to the peak value of the oscillating voltage is 54/125; (4) the second and third voltage harmonics are, respectively, 12.3% and 4.2% of the fundamental; and (5) the conductance per unit area for stochastic heating by the oscillating sheath is 2.98 ( lambda /sub D//s/sub m/)/sup 2/3/ ( epsilon /sup 2/n/sub 0//mu/sub e/), where n/sub 0/ is the ion density, lambda /sub D/ is the Debye length at the plasma-sheath edge, and u/sub e/=(8eT/sub e// pi m)/sup 1/2/ is the mean electron speed.<>
Keywords :
high-frequency discharges; plasma sheaths; 1 to 100 mtorr; 13.56 MHz; 50 to 1000 V; Child´s law sheath; Debye length; collisionless ion motion; free space permittivity; fundamental voltage harmonic; inertialess electrons; ion density; low pressure RF discharges; materials processing; mean electron speed; oscillating sheath; oscillating voltage; plasma-sheath edge; sheath capacitance; sheaths; sinusoidal current source; stochastic heating; voltage harmonics; Gas discharges; Plasma sheaths;
Conference_Titel :
Plasma Science, 1989. IEEE Conference Record - Abstracts., 1989 IEEE International Conference on
Conference_Location :
Buffalo, NY, USA
DOI :
10.1109/PLASMA.1989.166201