DocumentCode :
2336263
Title :
Facial feature localization using statistical models and SIFT descriptors
Author :
Li, Zisheng ; Imai, Jun-ichi ; Kaneko, Masahide
Author_Institution :
Dept. of Electron. Eng., Univ. of Electro-Commun., Chofu, Japan
fYear :
2009
fDate :
Sept. 27 2009-Oct. 2 2009
Firstpage :
961
Lastpage :
966
Abstract :
Active Shape Model (ASM) is a powerful statistical tool for image interpretation, especially in face alignment. In the standard ASM, local appearances are described by intensity profiles, and the model parameter estimation is based on the assumption that the profiles follow a Gaussian distribution. It suffers from variations of poses, illumination and expressions. In this paper, an improved ASM framework, GentleBoost based SIFT-ASM is proposed. Local appearances of landmarks are originally represented by SIFT (Scale-Invariant Feature Transform) descriptors, which are gradient orientation histograms based representations of image neighborhood. They can provide more robust and accurate guidance for search than grey-level profiles. Moreover, GentleBoost classifiers are applied to model and search the SIFT features instead of the unnecessary assumption of Gaussian distribution. Experimental results show that SIFT-ASM significantly outperforms the original ASM in aligning and localizing facial features.
Keywords :
Gaussian distribution; face recognition; image classification; image representation; Gaussian distribution; GentleBoost classifier; active shape model; face alignment; facial feature localization; facial landmark; image interpretation; image representation; intensity profile; local appearance model; model parameter estimation; scale-invariant feature transform descriptor; statistical model; Face; Facial features; Gaussian distribution; Histograms; Human robot interaction; Lighting; Noise robustness; Parameter estimation; Principal component analysis; Shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Robot and Human Interactive Communication, 2009. RO-MAN 2009. The 18th IEEE International Symposium on
Conference_Location :
Toyama
ISSN :
1944-9445
Print_ISBN :
978-1-4244-5081-7
Electronic_ISBN :
1944-9445
Type :
conf
DOI :
10.1109/ROMAN.2009.5326323
Filename :
5326323
Link To Document :
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