DocumentCode :
2336488
Title :
Correction method for a single chip power meter
Author :
Nagura, Hidetoshi ; Fujino, Kenji
Author_Institution :
Yokogawa Electr. Corp., Musashino, Japan
fYear :
1994
fDate :
10-12 May 1994
Firstpage :
1313
Abstract :
The single chip power meter is a programmable mixed signal IC for three phase power line measurement. The DSP block includes two programmable 32 bit processors which executes metering functions and calibration algorithm for six AD converter inputs. In the calibration algorithm correction methods for two major errors have been attempted: for a non-linearity error of input transformers and AD converters, for a phase leading error of the current transformers against the voltage transformers. 30 correction coefficients including frequency dependency are computed by an automatic calibration system. The experimental results demonstrate the efficiency of the corrections: the non-linearity of RMS current measurement has been reduced from ±0.17%FS to ±0.07%FS by the nonlinearity correction, the measurement offset error of three phase power has been reduced from ±3%FS to ±0.25%FS by the phase error correction. These correction techniques bring a breakthrough for cutting the production cost, by permitting use with inexpensive transformers which have less linearity and large characteristic deviation
Keywords :
analogue-digital conversion; calibration; computerised instrumentation; digital signal processing chips; electric current measurement; error compensation; mixed analogue-digital integrated circuits; phase measurement; power measurement; power system measurement; signal processing equipment; AD converter inputs; DSP block; RMS current measurement; calibration algorithm; calibration algorithm correction methods; correction method; current transformers; measurement offset error; nonlinearity correction; nonlinearity error; phase error correction; phase leading error; production cost; programmable 32 bit processors; programmable mixed signal IC; single chip power meter; three phase power; three phase power line measurement; Calibration; Current measurement; Current transformers; Digital signal processing chips; Error correction; Frequency conversion; Phase measurement; Power measurement; Semiconductor device measurement; Voltage transformers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location :
Hamamatsu
Print_ISBN :
0-7803-1880-3
Type :
conf
DOI :
10.1109/IMTC.1994.351815
Filename :
351815
Link To Document :
بازگشت