DocumentCode
2336589
Title
A design prototyping using AD mixed tester
Author
Yukawa, Akira ; Okamoto, Toshiyuki ; Maruyama, Yuuichi
Author_Institution
Sys. Micro Div., NEC Corp., Kawasaki, Japan
fYear
1994
fDate
10-12 May 1994
Firstpage
1289
Abstract
It is very difficult to expect performances of analog/digital mixed (AD-mixed) LSIs, taking into account of component fluctuations, before getting actual samples. In this paper, some method to investigate characteristics of such interface LSIs, especially oversampled converters, using analog resources or test chip of a specific component is discussed
Keywords
design for testability; digital-analogue conversion; large scale integration; mixed analogue-digital integrated circuits; sigma-delta modulation; test equipment; AD mixed tester; FFT; analog resources; analog/digital mixed LSI; component fluctuations; design prototyping; interface LSI; multi bit delta-sigma modulator; oversampled converters; test chip; Delta modulation; Filters; Fluctuations; Large scale integration; Linearity; Prototypes; Signal generators; Signal resolution; Signal to noise ratio; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location
Hamamatsu
Print_ISBN
0-7803-1880-3
Type
conf
DOI
10.1109/IMTC.1994.351820
Filename
351820
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