DocumentCode :
2336776
Title :
Two pattern classifiers for interval data based on binary regression models
Author :
De Souza, Renata M C R ; de A.Cysneiros, F.J. ; Queiroz, Diego C F ; Fagundes, Roberta A A
Author_Institution :
Centro de Inf., Univ. Fed. de Pernambuco, Recife
fYear :
2008
fDate :
13-16 Nov. 2008
Firstpage :
632
Lastpage :
637
Abstract :
This paper introduces two classifiers for interval symbolic data based on logit and probit regression models, respectively. Each example of the learning set is described by a feature vector, for which each feature value is an interval and a binary response that defines the class of this example. For each classifier two versions are considered. First fits a classic binary regression model conjointly on the lower and upper bounds of the interval values assumed by the variables in the learning set. Second fits a classic binary regression model separately on the lower and upper bounds of the intervals. The prediction of the class for new examples is accomplished from the computation of the posterior probabilities of the classes. To show the usefulness of this method, examples with synthetic symbolic data sets with overlapping classes are considered.
Keywords :
pattern classification; regression analysis; binary regression models; binary response; feature vector; interval symbolic data; learning set; logit model; pattern classifiers; posterior probabilities; probit regression model; synthetic symbolic data sets; Accuracy; Data analysis; Decision trees; Frequency measurement; Histograms; Logistics; Predictive models; Probability distribution; Upper bound; Weight measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Digital Information Management, 2008. ICDIM 2008. Third International Conference on
Conference_Location :
London
Print_ISBN :
978-1-4244-2916-5
Electronic_ISBN :
978-1-4244-2917-2
Type :
conf
DOI :
10.1109/ICDIM.2008.4746705
Filename :
4746705
Link To Document :
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