• DocumentCode
    2336975
  • Title

    Simultaneous measuring the resistivity and permeability of a film sample with double coils

  • Author

    Nonaka, Yoshihiro ; Nakane, Hiroshi ; Maeda, Takao ; Hasuike, Kiminori

  • Author_Institution
    Sci. Univ. of Tokyo, Japan
  • fYear
    1994
  • fDate
    10-12 May 1994
  • Firstpage
    1175
  • Abstract
    A method is proposed for a simultaneous measurement of the resistivity and permeability of a film by measuring the difference in the composite impedance of a pair of coils placed on both sides of the sample film facing each other. In first case, the current passes through the coils in the same direction and in second case, the current passes through the coils in opposite directions to each other. It was theoretically found that the optimum frequency for the measurement was proportional to the resistivity and inversely proportional to the thickness of a sample film in the case of paramagnetic films. This method was tested by measuring the resistivity of copper and brass films of a thickness ranging from 0.01 to 0.08 mm, and by simultaneously measuring the resistivity and permeability of nickel films of a thickness of 0.01 and 0.02 mm. The measured values of the resistivity with this method have correlated well with the values measured with the dc four-point probe method
  • Keywords
    brass; coils; copper; electrical conductivity measurement; magnetic permeability measurement; magnetic thin films; paramagnetic materials; 0.01 to 0.02 mm; Cu; Cu films; Cu-Zn; brass films; composite impedance; correlated well; dc four-point probe method; double coils; optimum frequency; paramagnetic films; permeability; resistivity; sample film; simultaneous measurement; thickness; Coils; Conductivity; Copper; Frequency measurement; Impedance measurement; Nickel; Paramagnetic materials; Permeability measurement; Testing; Thickness measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
  • Conference_Location
    Hamamatsu
  • Print_ISBN
    0-7803-1880-3
  • Type

    conf

  • DOI
    10.1109/IMTC.1994.351845
  • Filename
    351845