DocumentCode :
2337284
Title :
Correlation Properties of Large Scale Parameters from 2.66 GHz Multi-Site Macro Cell Measurements
Author :
Zhu, Meifang ; Tufvesson, Fredrik ; Medbo, Jonas
Author_Institution :
Dept. of Electr. & Inf. Technol., Lund Univ., Lund, Sweden
fYear :
2011
fDate :
15-18 May 2011
Firstpage :
1
Lastpage :
5
Abstract :
Multi-site measurements for urban macro cells at 2.66 GHz are performed with three base stations and one mobile station. In order to analyze the correlation properties of large scale parameters, we split up the routes into subsets, where it can be assumed that wide-sense stationarity (WSS) applies. The autocorrelation distance and correlation properties of large scale parameters for each link are analyzed. By comparing these properties with the corresponding parameters from the COST 2100 and WINNER II models, we can see that the measured autocorrelation distance of the shadow fading as well the autocorrelation distance of delay spread have similar properties as in the two models. The shadow fading and delay spread from the same link are negatively correlated and match the two models well. Based on the WSS subsets, we can see that large scale parameters for different links can be correlated, also when two BSs are far away from each other. In those cases the correlation of different links tends to be positively correlated when both base stations are in the same direction compared to the movement of the MS, otherwise the two links are usually negatively correlated.
Keywords :
cellular radio; correlation methods; radio links; telecommunication network routing; COST 2100 model; WINNER II models; autocorrelation distance; base stations; delay spread; frequency 2.66 GHz; large scale parameter correlation property; mobile station; multisite macro cell measurements; shadow fading; wide-sense stationarity; Antenna measurements; Channel models; Correlation; Delay; Fading; Scattering; Wireless communication;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vehicular Technology Conference (VTC Spring), 2011 IEEE 73rd
Conference_Location :
Yokohama
ISSN :
1550-2252
Print_ISBN :
978-1-4244-8332-7
Type :
conf
DOI :
10.1109/VETECS.2011.5956712
Filename :
5956712
Link To Document :
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