Title :
REALIZATION OP FAIL-SAFE SEQUENTIAL MACHINES BY USING K-OUT-OF-N CODE
Author :
Tohma, Y. ; Ohyana, Y. ; Sakai, R.
Keywords :
Circuit faults; Combinational circuits; Equations; Fault detection; PROM; Strontium;
Conference_Titel :
Fault-Tolerant Computing, 1995, Highlights from Twenty-Five Years., Twenty-Fifth International Symposium on
Print_ISBN :
0-8186-7150-5
DOI :
10.1109/FTCSH.1995.532640
