• DocumentCode
    233774
  • Title

    A Coverage Guided Mining Approach for Automatic Generation of Succinct Assertions

  • Author

    Sheridan, D. ; Lingyi Liu ; Hyungsul Kim ; Vasudevan, S.

  • Author_Institution
    Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2014
  • fDate
    5-9 Jan. 2014
  • Firstpage
    68
  • Lastpage
    73
  • Abstract
    Machine learning techniques are widely employed for automatic assertion generation in hardware verification. Our previous method [16] uses a decision tree based approach for mining assertions and does not have design coverage related feedback. The assertions are unaware of the design, over-constrained and have low expressiveness. We introduce a coverage guided mining approach for mining assertions from simulation traces. Our approach combines association rule learning, greedy set covering and formal verification. It circumvents the exhaustive rule generation of association mining using coverage feedback. The algorithm has been implemented as one part of GoldMine1. Experiments using a variety of designs, including USB, PCI and OpenRisc, show that the assertions generated by coverage guided association mining cover an average of 6.14 times input space than those generated by decision tree based mining algorithms. We also show that the coverage guided association mining produces an average of 2.75 times fewer propositions per assertion than decision tree based mining. All these mean the assertions generated by coverage guided association mining are more succinct, and of higher value for hardware design verification.
  • Keywords
    data mining; decision trees; formal verification; learning (artificial intelligence); association rule learning; automatic generation; coverage feedback; coverage guided mining approach; decision tree; formal verification; greedy set covering; hardware verification; machine learning techniques; mining assertions; succinct assertions; Algorithm design and analysis; Association rules; Decision trees; Input variables; Measurement; Runtime;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design and 2014 13th International Conference on Embedded Systems, 2014 27th International Conference on
  • Conference_Location
    Mumbai
  • ISSN
    1063-9667
  • Type

    conf

  • DOI
    10.1109/VLSID.2014.19
  • Filename
    6733108