• DocumentCode
    2337788
  • Title

    The SURE Approach to SAR Image Denoising Based on Multiscale Bandelet Contextual Model

  • Author

    Huang, Daxiang ; Yan, Jingwen ; Zhang, Anfa ; Wang, Zhixi

  • Author_Institution
    Dept. of Electron. Eng., Shantou Univ., Shantou, China
  • fYear
    2010
  • fDate
    23-25 April 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, a new denoising method is presented for Synthetic Aperture Radar (SAR) image, based on Stein´s unbiased risk estimate (SURE) and on multiscale orthogonal bandelet domain. Unlike most existing denoising algorithms, A key point of our approach is that, using contextual model to compute contextual values of bandelet coefficients and then computing SURE thresholding according to these values. Multiscale orthogonal bandelet, a multiresolution geometry analysis tool, uses an adaptive segmentation and a local geometric flow suited to capture the anisotropic regularity of edge structures and provide an optimal representation of noisy SAR image. SURE threshold is used to handle outliers and heavy-tail noise, and it aims to minimize the mean-squared error between the true and restored image. Experimental results using real SAR image demonstrate that the approach can remove the speckle noise efficiently and preserve edge of SAR image better.
  • Keywords
    image denoising; image segmentation; mean square error methods; minimisation; SAR image denoising; SURE approach; Stein unbiased risk estimation; adaptive segmentation; local geometric flow; mean-squared error minimization; multiresolution geometry analysis; multiscale bandelet contextual model; orthogonal bandelet domain; synthetic aperture radar; Anisotropic magnetoresistance; Context modeling; Geometry; Image analysis; Image denoising; Image resolution; Image restoration; Image segmentation; Noise reduction; Synthetic aperture radar;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Engineering and Computer Science (ICBECS), 2010 International Conference on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-5315-3
  • Type

    conf

  • DOI
    10.1109/ICBECS.2010.5462300
  • Filename
    5462300