• DocumentCode
    2337807
  • Title

    Analysis of The Ejector Critical Back Pressure to A Ejector Refrigeration System

  • Author

    Xiao-Wei, Fan ; Jing, Wei ; Hui-fan, Zheng

  • Author_Institution
    Sch. of Energy & Environ., Zhongyuan Univ. of Technol., Zhengzhou, China
  • fYear
    2009
  • fDate
    25-27 May 2009
  • Firstpage
    2163
  • Lastpage
    2167
  • Abstract
    In order to enhance the ejector performance, a model for the solar ejection refrigeration system used R134a as refrigerant has been established in this paper. The relationship between the ejector critical back pressure and the system working condition has been discussed. It is found that the critical back pressure increases with the evaporation and generation temperature. The critical entrainment ratio of an ejector is in direct proportion to the evaporation temperature, but is in inverse proportion to the generation temperature. With the back pressure increasing, the refrigeration system COP value keeps almost constant firstly and then reduced. When the generator temperature is at 358K and the evaporator temperature is at 283K, the critical back pressure will be equal to 0.96MPa, the ejector´s entrainment ratio is 0.27 and the system COP can attain to 0.24.
  • Keywords
    evaporation; refrigerants; refrigeration; COP value; R134a refrigerant; ejector critical back pressure; ejector refrigeration system; evaporation temperature; generation temperature; solar ejection refrigeration system; temperature 283 K; temperature 358 K; Computational modeling; Electronic mail; Employee welfare; Equations; Fluid dynamics; Performance analysis; Refrigerants; Refrigeration; Solar power generation; Temperature; critical back pressure; critical entrainment ratio; ejection refrigeration; ejector;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications, 2009. ICIEA 2009. 4th IEEE Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-2799-4
  • Electronic_ISBN
    978-1-4244-2800-7
  • Type

    conf

  • DOI
    10.1109/ICIEA.2009.5138580
  • Filename
    5138580