Title :
ED/FI: A TECHNIQUE FOR IMPROVING COMPUTER SYSTEM RAS
Author :
Bossen, D.C. ; Hsiao, M.Y.
Keywords :
Circuit faults; Computer architecture; Computer errors; Fault detection; Fault diagnosis; Fault tolerance; Hardware; Large scale integration; Packaging; Testing;
Conference_Titel :
Fault-Tolerant Computing, 1995, Highlights from Twenty-Five Years., Twenty-Fifth International Symposium on
Print_ISBN :
0-8186-7150-5
DOI :
10.1109/FTCSH.1995.532644
