DocumentCode :
2337998
Title :
A GENERALIZED THEORY OF FAIL+SAFE SYSTEMS
Author :
Nicolaidis, M. ; Noraz, S. ; Courtois, B.
fYear :
1995
fDate :
27-30 Jun 1995
Firstpage :
273
Keywords :
Circuit faults; Electrical fault detection; Fault detection; Hafnium; Laboratories;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Fault-Tolerant Computing, 1995, Highlights from Twenty-Five Years., Twenty-Fifth International Symposium on
Print_ISBN :
0-8186-7150-5
Type :
conf
DOI :
10.1109/FTCSH.1995.532646
Filename :
532646
Link To Document :
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