Title :
A GENERALIZED THEORY OF FAIL+SAFE SYSTEMS
Author :
Nicolaidis, M. ; Noraz, S. ; Courtois, B.
Keywords :
Circuit faults; Electrical fault detection; Fault detection; Hafnium; Laboratories;
Conference_Titel :
Fault-Tolerant Computing, 1995, Highlights from Twenty-Five Years., Twenty-Fifth International Symposium on
Print_ISBN :
0-8186-7150-5
DOI :
10.1109/FTCSH.1995.532646
