DocumentCode :
2338068
Title :
Analysis of multiple-foil XRL targets using X-ray spectroscopy
Author :
Wang, Jiacheng ; Boehly ; Yaakobi, B. ; Shvarts ; Epstein, Richard ; Meyerhofer, D. ; Richardson, Martin C. ; Russotto ; Soures
Author_Institution :
Lab. for Laser Energetics, Rochester Univ., NY, USA
fYear :
1989
fDate :
0-0 1989
Firstpage :
135
Abstract :
Summary Form only given, as follows. Multiple-foil collisional excitation X-ray laser targets have been studies spectroscopically. Using spatially resolved 3d-2p X-ray spectra, the temperatures and densities obtained in single- and double-foil geometries have been compared. The ratio of the dipole transitions to the electric quadrupole transitions in the neonlike species has been used as a density diagnostic. An average-ion atomic physics model has been used to describe the ionization process, and a relativistic atomic physics code has been used for calculation of the level energies, populations, and gain calculations. The results confirm that the double-foils provide higher densities and in some cases concave density profiles. The extreme ultraviolet spectra in the range of 20-300 AA show the effect of target geometry and incident laser intensity on the laser lines and the ionization balance.<>
Keywords :
X-ray chemical analysis; X-ray lasers; spectrochemical analysis; 20 to 300 AA; Ne-like species; X-ray spectroscopy; average-ion atomic physics model; concave density profiles; densities; density diagnostic; dipole transitions; double-foil geometries; electric quadrupole transitions; extreme ultraviolet spectra; gain calculations; incident laser intensity; ionization balance; isoelectronic series; laser lines; level energies; multiple foil collisional excitation X-ray laser targets; populations; relativistic atomic physics code; single-foil geometry; spatially resolved 3d-2p X-ray spectra; target geometry; temperatures; Spectrochemical analysis; X-ray chemical analysis; X-ray lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1989. IEEE Conference Record - Abstracts., 1989 IEEE International Conference on
Conference_Location :
Buffalo, NY, USA
Type :
conf
DOI :
10.1109/PLASMA.1989.166216
Filename :
166216
Link To Document :
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