A METHODOLOGY FOR FUNCTIONAL LEVEL TESTING OF MICROPROCESSORS

Author

Thatte, Satish M. ; Abraham, Jacob A.

fYear

1995

fDate

27-30 Jun 1995

Firstpage

326

Keywords

Circuit faults; Circuit testing; Data processing; Digital systems; Fault detection; Logic; Memory; Microprocessors; Registers; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Fault-Tolerant Computing, 1995, Highlights from Twenty-Five Years., Twenty-Fifth International Symposium on

Print_ISBN

0-8186-7150-5

Type

DOI

10.1109/FTCSH.1995.532654

Filename

532654

Link To Document