Title :
X-ray inspection image enhencement using shearlet transform
Author :
Lin, Sheng-Fuu ; Wu, Tung-Ying ; Hong, Yu-Bi
Author_Institution :
Dept. of Electr. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
In automatic X-ray inspection, to denoise and enhance characteristics is a very important issue for application, especially the images used to inspect the wires in chips. Because the methods used to enhance or denoise may degrade the characteristic of the wires which can be seen as curves such that the efficiency is not enough. Shearlet has been approved of its perfect performance on curve description. In this paper, the method is applied and the method of coefficient modification is used. As a result, it shows that the wires are effectively enhanced while the noise is also attenuated.
Keywords :
X-ray imaging; image denoising; image enhancement; inspection; lead bonding; production engineering computing; transforms; wires; Shearlet transforms; X-ray inspection; image denoising; image enhancement; noise attenuation; wire binding; Frequency domain analysis; Image reconstruction; Noise; Wavelet transforms; Wires; X-ray imaging; X-ray; shearlet transform inspection;
Conference_Titel :
Industrial Electronics and Applications (ICIEA), 2012 7th IEEE Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-2118-2
DOI :
10.1109/ICIEA.2012.6361012