Title :
RANDOM TESTING OF THE DATA PROCESSING SECTION OF A MICROPROCESSOR
Author :
Thevenod-Fosse, Pascale ; David, Rene
Keywords :
Circuit faults; Circuit testing; Data processing; Electrical fault detection; Fault detection; Microprocessors; Probability distribution; Registers; Sequential analysis; Sequential circuits;
Conference_Titel :
Fault-Tolerant Computing, 1995, Highlights from Twenty-Five Years., Twenty-Fifth International Symposium on
Print_ISBN :
0-8186-7150-5
DOI :
10.1109/FTCSH.1995.532657
