DocumentCode :
2338163
Title :
RANDOM TESTING OF THE DATA PROCESSING SECTION OF A MICROPROCESSOR
Author :
Thevenod-Fosse, Pascale ; David, Rene
fYear :
1995
fDate :
27-30 Jun 1995
Firstpage :
344
Keywords :
Circuit faults; Circuit testing; Data processing; Electrical fault detection; Fault detection; Microprocessors; Probability distribution; Registers; Sequential analysis; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Fault-Tolerant Computing, 1995, Highlights from Twenty-Five Years., Twenty-Fifth International Symposium on
Print_ISBN :
0-8186-7150-5
Type :
conf
DOI :
10.1109/FTCSH.1995.532657
Filename :
532657
Link To Document :
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