• DocumentCode
    2338163
  • Title

    RANDOM TESTING OF THE DATA PROCESSING SECTION OF A MICROPROCESSOR

  • Author

    Thevenod-Fosse, Pascale ; David, Rene

  • fYear
    1995
  • fDate
    27-30 Jun 1995
  • Firstpage
    344
  • Keywords
    Circuit faults; Circuit testing; Data processing; Electrical fault detection; Fault detection; Microprocessors; Probability distribution; Registers; Sequential analysis; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fault-Tolerant Computing, 1995, Highlights from Twenty-Five Years., Twenty-Fifth International Symposium on
  • Print_ISBN
    0-8186-7150-5
  • Type

    conf

  • DOI
    10.1109/FTCSH.1995.532657
  • Filename
    532657
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2338163