DocumentCode
2338171
Title
ON THE ACCELERATION OF TEST GENERATION ALGORlTHMS
Author
Fujiwara, Hideo ; Shimono, Takeshi
fYear
1995
fDate
27-30 Jun 1995
Firstpage
350
Keywords
Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Electrical fault detection; Electronic equipment testing; Life estimation; Logic testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Fault-Tolerant Computing, 1995, Highlights from Twenty-Five Years., Twenty-Fifth International Symposium on
Print_ISBN
0-8186-7150-5
Type
conf
DOI
10.1109/FTCSH.1995.532658
Filename
532658
Link To Document