DocumentCode :
2338240
Title :
A model for incorporating the effects of nonzero switching-time constants in electrooptic masks used in Hadamard-transform spectrometry
Author :
Xiong, J. ; Dyer, R.A. ; Dyer, S.A.
Author_Institution :
Litronics Ind. Inf. Syst., Costa Mesa, CA, USA
fYear :
1994
fDate :
10-12 May 1994
Firstpage :
1028
Abstract :
Hadamard-transform (HT) spectrometers offer a multiplex advantage over conventional monochromators, making them very useful in situations in which the signal-to-noise ratio is low. HT spectrometers having no moving parts can be implemented by substituting; an electrooptic mask for the moving mask in the optical path. However, the physical properties of an electrooptic mask introduce two types of nonidealities-static and dynamic-into the measurement system. These nonidealities can cause distortions in the acquired spectra if their effects are neglected in the signal-recovery process. We have developed two complete system models which incorporate the effects of both static and dynamic nonidealities. In addition, we have devised recovery schemes applicable for each system model and have designed computationally efficient implementations of the recovery schemes
Keywords :
computational complexity; electro-optical devices; image processing; spectroscopy; spectroscopy computing; transforms; Hadamard-transform spectrometry; computationally efficient implementations; distortions; dynamic nonidealities; effects of nonzero switching-time constants; electrooptic mask; electrooptic masks; moving mask; recovery schemes; signal-recovery process; signal-to-noise ratio; spectrum recovery method; static nonidealities; Information systems; Noise measurement; Optical distortion; Radiation detectors; Signal processing; Signal to noise ratio; Spectroscopy; Steady-state; Switches; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location :
Hamamatsu
Print_ISBN :
0-7803-1880-3
Type :
conf
DOI :
10.1109/IMTC.1994.351929
Filename :
351929
Link To Document :
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