• DocumentCode
    2338374
  • Title

    Network analysis of nonlinear devices under multi-frequency excitation

  • Author

    Lê, Di-Luân ; Ghannouchi, Fadhel M.

  • Author_Institution
    Microwave Res. Lab., Ecole Polytech. de Montreal, Que., Canada
  • fYear
    1994
  • fDate
    10-12 May 1994
  • Firstpage
    998
  • Abstract
    This paper describes a measurement technique suitable for characterizing nonlinear microwave devices operating under multi-frequency excitation. A dual six-port network analyzer configured for simultaneous load-pull and source-pull measurement allows the characterization of nonlinear devices under multi-tone excitation, for use as mixers and broadband power amplifiers. The performance of a particular circuit can be optimize as a function of source and load impedances, at each input and output signal frequencies. Measurement results for the MESFET NE 76184, resistive mixer (2.9 to 7.1 GHz) show that a higher performance can be obtained by choosing independently the appropriate termination for input and output frequencies. The experimental results are also useful for the device modelling purposes
  • Keywords
    Schottky gate field effect transistors; microwave measurement; mixers (circuits); network analysers; nonlinear network analysis; solid-state microwave circuits; 2.9 to 7.1 GHz; MESFET NE 76184; broadband power amplifiers; device modelling; dual six-port network analyzer; load-pull measurement; mixers; multi-tone excitation; multifrequency excitation; network analysis; nonlinear devices; nonlinear microwave devices; resistive mixer; source-pull measurement; Broadband amplifiers; Circuits; Frequency measurement; Impedance; MESFETs; Measurement techniques; Microwave devices; Microwave theory and techniques; Power amplifiers; Power measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
  • Conference_Location
    Hamamatsu
  • Print_ISBN
    0-7803-1880-3
  • Type

    conf

  • DOI
    10.1109/IMTC.1994.351937
  • Filename
    351937