Title :
2 MeV heavy ion beam probe system for text upgrade
Author :
Hickok ; Crowley, T.P. ; Schoch, P.M. ; Connor, Kenneth A. ; Ouroua, H. ; McLaren, P.E. ; Lewis ; Schatz, J.G.
Author_Institution :
Rensselaer Polytechnic Institute
Keywords :
Electrons; Energy measurement; Ion beams; Particle beams; Plasma accelerators; Plasma measurements; Probes; Prototypes; Switches; Voltage;
Conference_Titel :
Plasma Science, 1991. IEEE Conference Record - Abstracts., 1991 IEEE International Conference on
Conference_Location :
Williamsburg, VA, USA
Print_ISBN :
0-7803-0147-1
DOI :
10.1109/PLASMA.1991.695790
