Title :
A high-speed image acquisition system for USB2.0
Author :
Xu, Zhiyue ; Zhang, Xian ; Chen, Yanpeng
Author_Institution :
Sch. of Autom. Sci. & Electr. Eng., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
Abstract :
High-speed image capture technology is widely used in image signal transmission, processing, pattern recognition and industrial control. LVDS signal transmission technology and Hotlink transmission technology are two kinds of image signal transmission method who has been widely used in different areas because its own strengths. Because of its high-speed and strong interference immunity, LVDS signals have became the ideal choice in industrial on-site for high-speed signal long-term transmission. Hotlink, a new generation interface for point to point high-speed serial signal transmission, is gradually being accepted by the users because of the promotion of Cypress. FPGA, field programmable gate array, is used as the core of the design PCB for its low cost, flexible. We take advantage of their strengths, use FPGA collect the signal from LVDS interface or Hotlink interface, and translate the signal into the form that meets the USB protocol, then translate the image data to the computer throw USB interface.
Keywords :
data acquisition; field programmable gate arrays; image processing; interference (signal); peripheral interfaces; printed circuit design; signal detection; visual communication; Cypress; FPGA; Hotlink interface; LVDS interface; LVDS signal transmission technology; PCB design; USB protocol; USB2.0 interface; field programmable gate array; high-speed image acquisition system; high-speed image capture technology; image data translation; image signal processing; industrial control; interference immunity; low-voltage differential signal; pattern recognition; point-to-point high-speed serial signal transmission; Computers; Field programmable gate arrays; Hardware; Protocols; Registers; Timing; Universal Serial Bus; FPGA; Hotlink; LVDS; USB; image acquisition;
Conference_Titel :
Industrial Electronics and Applications (ICIEA), 2012 7th IEEE Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-2118-2
DOI :
10.1109/ICIEA.2012.6361032
