• DocumentCode
    2338541
  • Title

    Exact robustness analysis for highly structured frequency-domain uncertainties

  • Author

    Latchman, H.A. ; Crisalle, O.D.

  • Author_Institution
    Dept. of Electr. Eng., Florida Univ., Gainesville, FL, USA
  • Volume
    6
  • fYear
    1995
  • fDate
    21-23 Jun 1995
  • Firstpage
    3982
  • Abstract
    Develops a stability criterion for systems with uncertainties which are manifested in the frequency domain by simply-connected and closed, arbitrary uncertainty regions which satisfy a mild convexity constraint. In particular, well-known stability results for the case of disk-bounded frequency domain uncertainties are recovered as a special case of the proposed approach. The main results hinge on the definition of the critical direction as the direction of the line joining the -1+j0 point to the nominal frequency-response at a particular frequency. It is argued that the relevant subset of the uncertainty lies along this line, and this idea is exploited to yield a general stability criterion. An example arising from system and uncertainty identification is presented to illustrate the ideas developed in the paper. An application of the results of this paper yields exact and explicit formulae for the robust stability of systems with ellipsoidal parametric uncertainties
  • Keywords
    frequency response; frequency-domain analysis; identification; robust control; stability criteria; uncertain systems; disk-bounded frequency domain uncertainties; ellipsoidal parametric uncertainties; exact robustness analysis; general stability criterion; highly structured frequency-domain uncertainties; identification; mild convexity constraint; nominal frequency-response; robust stability; Chemical engineering; Fasteners; Frequency domain analysis; Frequency response; Information analysis; MIMO; Robust stability; Robustness; Stability criteria; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, Proceedings of the 1995
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    0-7803-2445-5
  • Type

    conf

  • DOI
    10.1109/ACC.1995.532680
  • Filename
    532680