DocumentCode :
2338761
Title :
Precision measurement of hf/2e voltage at 63 K with superconducting weak-links under 100-120 GHz irradiation
Author :
Matsui, Toshiaki ; Kiyokawa, Masahiro ; Kitamura, Hidekazu ; Miyazaki, Hisashi ; Nakazoe, Jun ; Ohta, Hiroshi
Author_Institution :
Commun. Res. Lab., Minist. of Posts & Telecommun., Koganei, Japan
fYear :
1994
fDate :
10-12 May 1994
Firstpage :
921
Abstract :
A constriction of YBCO polycrystalline film, in which a network of grain boundary Josephson weak-links is naturally formed, behaves like a single Josephson element. Under 100-120 GHz irradiation, Shapiro-step like response is observed at voltage Vn=n(hf/2e) which is expected for a single Josephson weak-link. For verification of the Josephson-like effect, precision measurement of hf/2e voltage is made at 63 K by using the weak-link device of YBCO film. The measured values of inter-current-step voltage match the theoretical values with an error of 10 ppm. The result verifies that the frequency of oscillating pair current depends not on the partial potential difference but on the total potential difference between two bank electrodes, and that the HTS weak-links can be used as a precision voltage-reference source in millivolt and nanovolt regions
Keywords :
barium compounds; grain boundaries; high-temperature superconductors; measurement standards; superconducting junction devices; superconducting thin films; voltage measurement; yttrium compounds; 100 to 120 GHz; 63 K; Josephson weak-links; Shapiro-step like response; YBCO polycrystalline film; YBaCuO; grain boundary; hf/2e voltage; inter-current-step voltage; millivolt region; nanovolt region; oscillating pair current; precision voltage-reference source; superconducting weak-links; voltage measurement; Frequency; Grain boundaries; Hafnium; High temperature superconductors; Josephson effect; Josephson junctions; Superconducting devices; Superconducting films; Superconductivity; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
Conference_Location :
Hamamatsu
Print_ISBN :
0-7803-1880-3
Type :
conf
DOI :
10.1109/IMTC.1994.351957
Filename :
351957
Link To Document :
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