Binary vs decade inductive voltage divider comparison and error decomposition

Author

Avramov, S. ; Stenbakken, G.N. ; Koffman, A.D. ; Oldham, N.M. ; Gammon, R.W.

Author_Institution

Electron. & Electr. Eng. Lab., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA

fYear

1994

fDate

10-12 May 1994

Firstpage

917

Abstract

An automatic inductive voltage divider (IVD) characterization method that can measure linearity by comparing IVDs with different structures is suggested. Structural models are employed to decompose an error vector into components that represent each divider. Initial tests at 400 Hz show that it is possible to separate errors due to binary and decade structures with a 2σ uncertainty of 0.05 parts per million (ppm)

Keywords

automatic testing; autotransformers; calibration; characteristics measurement; electronic equipment testing; voltage dividers; voltage measurement; binary structures; binary voltage divider; decade inductive voltage divider; decade structures; error decomposition; error vector; linear error model; structural models; Matrix decomposition; Noise measurement; Noise reduction; Parameter estimation; Predictive models; Redundancy; Switches; Testing; Transformers; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE

Conference_Location

Hamamatsu

Print_ISBN

0-7803-1880-3

Type

conf

DOI

10.1109/IMTC.1994.351958

Filename

351958