Title :
Process Variation Aware Synthesis of Application-Specific MPSoCs to Maximize Yield
Author :
Kapadia, Nishit ; Pasricha, Sudeep
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado State Univ., Fort Collins, CO, USA
Abstract :
In contemporary semiconductor technologies, considerable unpredictability in the behavior of manufactured chips is being observed due to the effects of process variations. This unpredictability translates into variations in power and performance within these chips. At the same time, with ever shrinking power budgets and rising cooling costs, most chip designs need to satisfy a hard limit on the maximum power that the chip can dissipate. In such a scenario, the yield of a design for a given process depends on the number of chips meeting both performance and power constraints. In this work, we propose a novel process variation-aware MPSoC synthesis framework that performs simultaneous mapping and voltage assignment of cores to mitigate the adverse effects of process variations while maximizing yield. Our experimental results show average improvements ranging from 2× to 3.8× in power-performance yield over other variation-aware MPSoC synthesis frameworks proposed in prior literature.
Keywords :
application specific integrated circuits; integrated circuit yield; microprocessor chips; system-on-chip; application-specific MPSoC; power constraints; power-performance yield; process variation aware synthesis; simultaneous mapping; voltage assignment; Benchmark testing; Clocks; Multicore processing; Power dissipation; Routing; Systematics; Tiles; algorithms; design automation; mapping; system-level CAD; voltage islands;
Conference_Titel :
VLSI Design and 2014 13th International Conference on Embedded Systems, 2014 27th International Conference on
Conference_Location :
Mumbai
DOI :
10.1109/VLSID.2014.53