Static and dynamic testing of A/D converters using a VXI based system

Author

Serra, A. Ciuz ; Girão, P. Silva

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Inst. Superior Tecnico, Lisbon, Portugal

fYear

1994

fDate

10-12 May 1994

Firstpage

903

Abstract

A VXIbus based system to test analog to digital converters (ADC´s) is presented. The system can perform both static and dynamic tests. In the static test the input voltage of the converter is generated by an IEEE 488 programmable dc calibrator. Dynamic test is based on the analysis of the converter output when a known sinusoidal input voltage is applied to the ADC. The differential and integral nonlinearities, gain and offset errors of the converter are obtained in both tests. Results for a 12 bit ADC are presented

Keywords

analogue-digital conversion; automatic test equipment; electronic equipment testing; peripheral interfaces; 12 bit ADC; A/D converters; IEEE 488 programmable dc calibrator; VXI based system; differential nonlinearities; dynamic testing; gain; integral nonlinearities; offset errors; sinusoidal input voltage; static testing; Analog-digital conversion; Control systems; DC generators; Frequency; Instruments; Nonlinear dynamical systems; Performance evaluation; Sampling methods; System testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE

Conference_Location

Hamamatsu

Print_ISBN

0-7803-1880-3

Type

conf

DOI

10.1109/IMTC.1994.351962

Filename

351962